transformers
11745b4e - [Tests] Improve test_attention_outputs (#20701)

Commit

3 years ago

[Tests] Improve test_attention_outputs (#20701) * Improve tests * Improve TF tests * Apply suggestion * Fix test Co-authored-by: Niels Rogge <nielsrogge@Nielss-MacBook-Pro.local>

References

#20701 - [Tests] Improve test_attention_outputs

#27720 - Add common processor tests

#29969 - [SigLIP] Add fast tokenizer

#32831 - [Docs] Update resources

#33111 - [Backbone] Remove out_features everywhere

#33174 - [Zero-shot image classification pipeline] Remove tokenizer_kwargs

#39821 - Support MetaCLIP 2

#58 - Add EoMT DINOv3 model

#59 - Fix attention mask handling in EoMT-DINOv3 converter

#41212 - Add EoMT with DINOv3 backbone

#62 - Add initial DEIMv2 model implementation

Author

NielsRogge

Parents

722bf7ef

transformers 11745b4e - [Tests] Improve test_attention_outputs (#20701)

transformers
11745b4e - [Tests] Improve test_attention_outputs (#20701)