transformers
2199382d - Use random_attention_mask for TF tests (#16517)

Commit

3 years ago

Use random_attention_mask for TF tests (#16517) * use random_attention_mask for TF tests * Fix for TFCLIP test (for now). Co-authored-by: ydshieh <ydshieh@users.noreply.github.com>

References

#16517 - Use random_attention_mask for TF tests

#19449 - [WIP] Fix weights initialization of several vision models

#27720 - Add common processor tests

#29969 - [SigLIP] Add fast tokenizer

#32831 - [Docs] Update resources

#33111 - [Backbone] Remove out_features everywhere

#33174 - [Zero-shot image classification pipeline] Remove tokenizer_kwargs

#39821 - Support MetaCLIP 2

#59 - Fix attention mask handling in EoMT-DINOv3 converter

#62 - Add initial DEIMv2 model implementation

#65 - Fix RTDetrV2 sine position embedding ordering

Author

ydshieh

Parents

823dbf8a

transformers 2199382d - Use random_attention_mask for TF tests (#16517)

transformers
2199382d - Use random_attention_mask for TF tests (#16517)