TST: Fix instruct-blip tests (#31088) - SemanticDiff

Commit

1 year ago

TST: Fix instruct-blip tests (#31088) * fix flan t5 tests * better format

References

#29969 - [SigLIP] Add fast tokenizer

#31088 - TST: Fix instruct-blip tests

#32831 - [Docs] Update resources

#33111 - [Backbone] Remove out_features everywhere

#33174 - [Zero-shot image classification pipeline] Remove tokenizer_kwargs

#39821 - Support MetaCLIP 2

#58 - Add EoMT DINOv3 model

#59 - Fix attention mask handling in EoMT-DINOv3 converter

#41212 - Add EoMT with DINOv3 backbone

#62 - Add initial DEIMv2 model implementation

Author

younesbelkada

younesbelkada

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