[SYCL][E2E] Fix test issue in `multiple-devices.cpp` (#21227)
The test is failing on some platforms with the following error:
`icx: error: argument unused during compilation: '-EHsc'`
The 'redundant' `EHsc` argument is only used to debug Window issues and
has no practical impact on the test. Therefore, adding the
`-Wno-unused-command-line-argument` option to suppress the error and fix
the test.
Signed-off-by: Hu, Peisen <peisen.hu@intel.com>
