[NewOffloadModel] Remove XFAIL from SYCL E2E tests for the new offloading model (#21435)
This PR removed the XFAIL from two SYCL E2E tests and replaced it with
UNSUPPORTED for the new offloading model. The specific changes are
below:
1. As described in https://github.com/intel/llvm/pull/20976,
`AOT/multiple-devices.cpp` is not supposed to run for the new offloading
model. Thus, the XFAIL for the new offloading model is removed and the
test is currently marked as UNSUPPORTED.
2. For `SeparateCompile/test.cpp`, because `clang-offload-bundler` and
`clang-offload-wrapper` should not be supported for the new offloading
model, this test is not supposed to run on the new offloading model. A
new test `NewOffloadDriver/separate_compile.cpp` is created specifically
for the new offloading model to test compiling device code separately.
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Co-authored-by: yixing.zhang <yixingzh@smtp.igk.intel.com>